%0 Journal Article
%A Yamada, Shigeru
%A Osaki, Shunji
%A Narihisa, Hiroyuki
%T A software reliability growth model with two types of errors
%J RAIRO - Operations Research - Recherche Opérationnelle
%D 1985
%P 87-104
%V 19
%N 1
%I EDP-Sciences
%U http://archive.numdam.org/item/RO_1985__19_1_87_0/
%G en
%F RO_1985__19_1_87_0