@article{RO_1985__19_1_87_0, author = {Yamada, Shigeru and Osaki, Shunji and Narihisa, Hiroyuki}, title = {A software reliability growth model with two types of errors}, journal = {RAIRO - Operations Research - Recherche Op\'erationnelle}, pages = {87--104}, publisher = {EDP-Sciences}, volume = {19}, number = {1}, year = {1985}, zbl = {0566.68029}, language = {en}, url = {http://archive.numdam.org/item/RO_1985__19_1_87_0/} }
TY - JOUR AU - Yamada, Shigeru AU - Osaki, Shunji AU - Narihisa, Hiroyuki TI - A software reliability growth model with two types of errors JO - RAIRO - Operations Research - Recherche Opérationnelle PY - 1985 SP - 87 EP - 104 VL - 19 IS - 1 PB - EDP-Sciences UR - http://archive.numdam.org/item/RO_1985__19_1_87_0/ LA - en ID - RO_1985__19_1_87_0 ER -
%0 Journal Article %A Yamada, Shigeru %A Osaki, Shunji %A Narihisa, Hiroyuki %T A software reliability growth model with two types of errors %J RAIRO - Operations Research - Recherche Opérationnelle %D 1985 %P 87-104 %V 19 %N 1 %I EDP-Sciences %U http://archive.numdam.org/item/RO_1985__19_1_87_0/ %G en %F RO_1985__19_1_87_0
Yamada, Shigeru; Osaki, Shunji; Narihisa, Hiroyuki. A software reliability growth model with two types of errors. RAIRO - Operations Research - Recherche Opérationnelle, Tome 19 (1985) no. 1, pp. 87-104. http://archive.numdam.org/item/RO_1985__19_1_87_0/
1. Statistical Analysis of Reliability and Life-Testing Models, Marcel Dekker, Inc., New York, 1978. | MR | Zbl
,2. On Tracking Reliability Growth, Proc. 1975 Annu. Reliability and Maintainability Symp., 1975, pp. 438-443.
,3. Learning Curve Approach to Reliability Monitoring, I.E.E.E. Trans. Aerosp., Vol. 2, 1964, pp. 563-566.
,4. Software Error Detection Model with Applications, J. Syst. Software, Vol. 1, 1980, pp. 243-249.
,5. Time-Dependent Error-Detection Rate Model for Software Reliability and Other Performance Measures, I.E.E.E. Trans. Reliab., Vol. R-28, 1979, pp. 206-211. | Zbl
and ,6. Software Reliability Research, in Statistical Computer Performance Evaluation, W. FREIBERGER, Ed., Academic Press, New York, 1972, pp. 465-484.
and ,7. Birth-Death and Bug Counting, I.E.E.E. Trans. Reliab., Vol R-32, 1983, pp. 37-47. | Zbl
,8. Theories of Software Reliability: How Good Are They and How Can They Be Improved?, I.E.E.E. Trans. Software Eng., Vol. SE-6, 1980, pp. 489-500.
,9. Event-Altered Rate Models for General Reliability Analysis, I.E.E.E. Trans. Reliab., Vol.R-28, 1979, p. 376-381. | Zbl
,10. Software Reliability Measurement, J. Syst. Software, Vol. 1, 1980, p. 223-241. | Zbl
,11. Applied Life Data Analysis, John Wiley and Sons, Inc., New York, 1982. | MR | Zbl
,12. Inflection S-shaped Software ReiiabUity Growth Model (in Japanese), I.RS.-Japan Proc. W.G.S.E. Meeting, Vol. 28, 1983.
and ,13. Software Reliability - Status and Perspectives, I.E.E.E. Trans. Software Eng., Vol. SE-8, 1982, p. 354-371.
and ,24. Stochastic Processes, John Wiley and Sons, Inc., New York, 1983. | MR | Zbl
,15. An Analysis of Competing Software Reliability Models, I.E.E.E. Trans. Software Eng., Vol. SE-4, 1978, pp. 104-120. | Zbl
and ,16. A State- and Time-Dependent Error Occurrence-Rate Software Reliability Model with Imperfect Debugging, Proc. 1981 Nat. Comput. Conf., 1981, pp. 311-315.
,17. Software Reliability: Measurement and Models, Proc. 1975 Annu. Reliability and Maintainability Symp., 1975, pp. 485-491. | Zbl
,18. On The Foundations of Reliability, Technometrics, Vol. 23 1981, pp. 1-13. | MR | Zbl
,19. Software Reliability Growth Models and Their Comparisons (in Japanese), Trans. I.E.C.E. Japan, Vol. J65-D, 1982, pp. 906-912; also Systems. Computers. Controls, Vol. 13, 1982, pp. 42-49.
and ,20. Reliability Growth Models for Hardware and Software Systems Based on Nonhomogeneous Poisson Processes: A Survey, Microelectron. Reliab., Vol. 23, 1983, pp. 91-112.
and ,21. S-shaped Software Reliability Growth Models with Four Types of Software Error Data, Int.J. Systems Sci., Vol. 14, 1983, pp. 683-692. | Zbl
and ,