@article{RO_1994__28_2_165_0, author = {Kapur, P. K. and Agarwala, Sanjay and Garg, R. B.}, title = {Bicriterion release policy for exponential software reliability growth model}, journal = {RAIRO - Operations Research - Recherche Op\'erationnelle}, pages = {165--180}, publisher = {EDP-Sciences}, volume = {28}, number = {2}, year = {1994}, zbl = {0857.90077}, language = {en}, url = {http://archive.numdam.org/item/RO_1994__28_2_165_0/} }
TY - JOUR AU - Kapur, P. K. AU - Agarwala, Sanjay AU - Garg, R. B. TI - Bicriterion release policy for exponential software reliability growth model JO - RAIRO - Operations Research - Recherche Opérationnelle PY - 1994 SP - 165 EP - 180 VL - 28 IS - 2 PB - EDP-Sciences UR - http://archive.numdam.org/item/RO_1994__28_2_165_0/ LA - en ID - RO_1994__28_2_165_0 ER -
%0 Journal Article %A Kapur, P. K. %A Agarwala, Sanjay %A Garg, R. B. %T Bicriterion release policy for exponential software reliability growth model %J RAIRO - Operations Research - Recherche Opérationnelle %D 1994 %P 165-180 %V 28 %N 2 %I EDP-Sciences %U http://archive.numdam.org/item/RO_1994__28_2_165_0/ %G en %F RO_1994__28_2_165_0
Kapur, P. K.; Agarwala, Sanjay; Garg, R. B. Bicriterion release policy for exponential software reliability growth model. RAIRO - Operations Research - Recherche Opérationnelle, Volume 28 (1994) no. 2, pp. 165-180. http://archive.numdam.org/item/RO_1994__28_2_165_0/
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